Blar i Brage NMBU på forfatter "Cappelen, Jon-Fredrik Blakstad"
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Light and elevated temperature induced degradation in multicrystalline silicon wafers studied by hyperspectral photoluminescence imaging
Cappelen, Jon-Fredrik Blakstad (Master thesis, 2019)Light and elevated temperature induced degradation (LeTID) has become a profound problem for the new PERC cells, reducing performance by as much as 16% during operation. The mechanism that governs the degradation is not ...